Résumé
This document presents a list of common practices in preparation methods of metallographic specimens for optical and scanning electron microscopy, including preliminary preparation, grinding and polishing of specimens as well as microstructure revelation methods covering the optical method, etching methods (chemical, electrolytic, constant potential, ion sputtering and high temperature relieving) and the interface layer method [1][2].
Informations générales
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État actuel: PubliéeDate de publication: 2022-07Stade: Norme internationale publiée [60.60]
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Edition: 1
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Comité technique :ISO/TC 17/SC 7ICS :77.080.20
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