ISO 23201:2015
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ISO 23201:2015
50501

Status : Published (Under review)

This standard was last reviewed and confirmed in 2022. Therefore this version remains current.
en
Format Language
std 1 151 PDF
std 2 151 Paper
  • CHF151
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Abstract

ISO 23201:2015 sets out a wavelength dispersive X-ray fluorescence spectrometric method for the analysis of aluminium oxide for trace amounts of any or all of the following elements: sodium, silicon, iron, calcium, titanium, phosphorus, vanadium, zinc, manganese, gallium, potassium, copper, chromium and nickel. These elements are expressed as the oxides Na2O, SiO2, Fe2O3, CaO, TiO2, P2O5, V2O5, ZnO, MnO, Ga2O3, K2O, CuO, Cr2O3, and NiO on an un-dried sample basis. The method is applicable to smelting-grade aluminium oxide. The concentration range covered for each of the components is also given.

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General information

  •  : Published
     : 2015-11
    : International Standard confirmed [90.93]
  •  : 1
     : 32
  • ISO/TC 226
    71.100.10 
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