This standard was last reviewed and confirmed in 2020.
Therefore this version remains current.
Abstract
PreviewISO 17901-2:2015 specifies the terms and measurement method concerning exposure characteristics (exposure characteristic curve, exposure at half-maximum, R-value, amplitude of refractive index modulation) for the hologram recorded by double-beam interference. The materials of hologram to be measured are not restricted to any particular ones. ISO 17901-2:2015 does not intend to restrict manufacturing process.
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Status: PublishedPublication date: 2015-07
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Edition: 1Number of pages: 20
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- ICS :
- 31.020 Electronic components in general
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en
| Format | Language | |
|---|---|---|
| std 1 124 | ||
| std 2 124 | Paper |
- CHF124
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