Resumen
ISO 18116:2005 gives guidance on methods of mounting and surface treatment for a specimen about to undergo surface chemical analysis. It is intended for the analyst as an aid in understanding the specialized specimen-handling conditions required for analyses by techniques such as Auger electron spectroscopy, secondary-ion mass spectrometry, and X-ray photoelectron spectroscopy.
Informaciones generales
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Estado: PublicadoFecha de publicación: 2005-08Etapa: Norma Internacional para revisar [90.92]
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Edición: 1Número de páginas: 16
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Comité Técnico :ISO/TC 201/SC 2ICS :71.040.40
- RSS actualizaciones
Ciclo de vida
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Ahora
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Será reemplazada por
En desarrolloISO/FDIS 20579-2