ISO 17867:2015
2015-05
Resumen
Small-angle X-ray scattering (SAXS) is a well-established technique that allows structural information to be obtained about inhomogeneities in materials with a characteristic length from 1 nm to 100 nm. Under certain conditions (narrow size distributions, appropriate instrumental configuration, and idealised shape) the limit of 100 nm can be significantly extended. ISO 17687:2015 specifies a method for the application of SAXS to the estimation of mean particle sizes in dilute dispersions where the interaction between the particles is negligible. This International Standard allows two complementary data evaluation methods to be performed, model fitting and Guinier approximation. The most appropriate evaluation method shall be selected by the analyst and stated clearly in the report. SAXS is sensitive to electron density fluctuations. Therefore, particles in solution and pores in a matrix can be studied in same way.
Informaciones generales
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Estado: RetiradaFecha de publicación: 2015-05Etapa: Retirada de la Norma Internacional [95.99]
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Edición: 1Número de páginas: 23
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Comité Técnico :ISO/TC 24/SC 4ICS :19.120
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Ciclo de vida
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Ahora
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Revisada por
PublicadoISO 17867:2020
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