International Standard
ISO 19668:2017
Surface chemical analysis — X-ray photoelectron spectroscopy — Estimating and reporting detection limits for elements in homogeneous materials
Reference number
ISO 19668:2017
Edición 1
2017-08
International Standard
Vista previa
ISO 19668:2017
65947
No disponible en español
Publicado (Edición 1, 2017)

ISO 19668:2017

ISO 19668:2017
65947
Idioma
Formato
CHF 129
Convertir Franco suizo (CHF) a tu moneda

Resumen

ISO 19668:2017 specifies a procedure by which elemental detection limits in X-ray photoelectron spectroscopy (XPS) can be estimated from data for a particular sample in common analytical situations and reported. This document is applicable to homogeneous materials and is not applicable if the depth distribution of elements is inhomogeneous within the information depth of the technique.

Informaciones generales

  •  : Publicado
     : 2017-08
    : Cierre de la revisión [90.60]
  •  : 1
     : 24
  • ISO/TC 201/SC 7
    71.040.40 
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