Resumen
ISO 16243:2011 specifies the minimum level of information to be reported by the analyst following the analysis of a test specimen using X‑ray photoelectron spectroscopy (XPS). It includes information that is to be recorded on or in the analytical record.
Informaciones generales
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Estado: PublicadoFecha de publicación: 2011-12Etapa: Cierre de la revisión [90.60]
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Edición: 1Número de páginas: 9
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Comité Técnico :ISO/TC 201/SC 2ICS :71.040.40
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