ISO 18118:2024
p
ISO 18118:2024
81742
No disponible en español

Estado : Publicado

es
Formato Idioma
std 1 129 PDF + ePub
std 2 129 Papel
  • CHF129
Convertir Franco suizo (CHF) a tu moneda

Resumen

This document gives guidance on the measurement and use of experimentally-determined relative sensitivity factors for the quantitative analysis of homogeneous materials by Auger electron spectroscopy and X-ray photoelectron spectroscopy. The methods described only apply to polycrystalline and amorphous materials, as effects inherent to single-crystal samples are not addressed.

Preview 

Previsualice esta norma en nuestra Plataforma de navegación en línea (OBP)

Informaciones generales

  •  : Publicado
     : 2024-02
    : Norma Internacional publicada [60.60]
  •  : 3
     : 22
  • ISO/TC 201/SC 7
    71.040.40 
  • RSS actualizaciones

Got a question?

Check out our FAQs

Customer care
+41 22 749 08 88

Opening hours:
Monday to Friday - 09:00-12:00, 14:00-17:00 (UTC+1)