ISO 24173:2009
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ISO 24173:2009
42052

Status : Withdrawn

This standard has been revised by ISO 24173:2024

Abstract

ISO 24173:2009 gives advice on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.

General information

  •  : Withdrawn
     : 2009-09
    : Withdrawal of International Standard [95.99]
  •  : 1
     : 43
  • ISO/TC 202
    71.040.50 
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Life cycle

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