Abstract
This document presents a list of common practices in preparation methods of metallographic specimens for optical and scanning electron microscopy, including preliminary preparation, grinding and polishing of specimens as well as microstructure revelation methods covering the optical method, etching methods (chemical, electrolytic, constant potential, ion sputtering and high temperature relieving) and the interface layer method [1][2].
Read sample
Preview this standard in our Online Browsing Platform (OBP)
General information
-
Status: PublishedPublication date: 2022-07Stage: International Standard published [60.60]
-
Edition: 1Number of pages: 17
-
Technical Committee :ISO/TC 17/SC 7ICS :77.080.20
- RSS updates
Life cycle
Got a question?
Check out our FAQs
Customer care
+41 22 749 08 88
Opening hours:
Monday to Friday - 09:00-12:00, 14:00-17:00 (UTC+1)