Reference number
ISO 18452:2005
International Standard
ISO 18452:2005
Fine ceramics (advanced ceramics, advanced technical ceramics) — Determination of thickness of ceramic films by contact-probe profilometer
Edition 1
2005-11
Read sample
ISO 18452:2005
38701
Published (Edition 1, 2005)
This publication was last reviewed and confirmed in 2019. Therefore this version remains current.

ISO 18452:2005

ISO 18452:2005
38701
Language
Format
CHF 63
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Abstract

ISO 18452:2005 specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. The method is suitable for film thicknesses in the range of 10 nm to 10 000 nm.

General information

  •  : Published
     : 2005-11
    : International Standard under systematic review [90.20]
  •  : 1
     : 9
  • ISO/TC 206
    81.060.30 
  • RSS updates

Life cycle

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