This standard was last reviewed and confirmed in 2017.
Therefore this version remains current.
Abstract
PreviewDescribes profiles and the general structure of contact (stylus) instruments for measuring surface roughness and waviness. Specifies the properties of the instrument which influence profile evaluation. Replaces the first edition of ISO 3274:1975 and ISO 1880:1979.
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Status: PublishedPublication date: 1996-12
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Edition: 2Number of pages: 13
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Technical Committee: ISO/TC 213 Dimensional and geometrical product specifications and verification
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- ICS :
- 17.040.30 Measuring instruments
Buy this standard
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| Format | Language | |
|---|---|---|
| std 1 92 | ||
| std 2 92 | Paper |
- CHF92
Life cycle
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Previously
WithdrawnISO 1880:1979
WithdrawnISO 3274:1975
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Now
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00
Preliminary
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10
Proposal
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20
Preparatory
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30
Committee
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40
Enquiry
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50
Approval
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60
Publication
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90
Review
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95
Withdrawal
Corrigenda / Amendments
PublishedISO 3274:1996/Cor 1:1998
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00
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Will be replaced by
Under developmentISO/CD 25178-601
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