Status : Published (Under review)

This standard was last reviewed and confirmed in 2019. Therefore this version remains current.
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Abstract

ISO 17470:2014 gives guidance for the identification of elements and the investigation of the presence of specific elements within a specific volume (on a μm3 scale) contained in a specimen, by analysing X-ray spectra obtained using wavelength dispersive X-ray spectrometers on an electron probe microanalyser or on a scanning electron microscope.

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General information

  • Status
     : Published
    Publication date
     : 2014-01
    Stage
    : International Standard under systematic review [90.20]
  • Edition
     : 2
    Number of pages
     : 10
  • Technical Committee :
    ISO/TC 202/SC 2
    ICS :
    71.040.99 
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