Reference number
ISO 17470:2014
© ISO 2024
International Standard
ISO 17470:2014
Microbeam analysis — Electron probe microanalysis — Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
Edition 2
2014-01
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Published (Edition 2, 2014)
This publication was last reviewed and confirmed in 2019. Therefore this version remains current.

ISO 17470:2014

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Format
CHF 63
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Abstract

ISO 17470:2014 gives guidance for the identification of elements and the investigation of the presence of specific elements within a specific volume (on a μm3 scale) contained in a specimen, by analysing X-ray spectra obtained using wavelength dispersive X-ray spectrometers on an electron probe microanalyser or on a scanning electron microscope.

General information

  • Status
     : Published
    Publication date
     : 2014-01
    Stage
    : Close of review [90.60]
  • Edition
     : 2
    Number of pages
     : 10
  • Technical Committee :
    ISO/TC 202/SC 2
    ICS :
    71.040.99 
  • RSS updates

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