International Standard
ISO 9220:2022
Metallic coatings — Measurement of coating thickness — Scanning electron microscope method
Reference number
ISO 9220:2022
Edition 2
2022-02
© ISO 2024
International Standard
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Published (Edition 2, 2022)

ISO 9220:2022

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Language
CHF 63
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Abstract

This document specifies a destructive method for the measurement of the local thickness of metallic and other inorganic coatings by examination of cross-sections with a scanning electron microscope (SEM). The method is applicable for thicknesses up to several millimetres, but for such thick coatings it is usually more practical to use a light microscope (see ISO 1463). The lower thickness limit depends on the achieved measurement uncertainty (see Clause 10).

NOTE       The method can also be used for organic layers when they are neither damaged by the preparation of the cross-section nor by the electron beam during imaging.

General information

  • Status
     : Published
    Publication date
     : 2022-02
    Stage
    : International Standard published [60.60]
  • Edition
     : 2
    Number of pages
     : 12
  • Technical Committee :
    ISO/TC 107
    ICS :
    25.220.40 
  • RSS updates

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