ISO 18118:2024
p
ISO 18118:2024
81742

Status : Published

en
Format Language
std 1 129 PDF + ePub
std 2 129 Paper
  • CHF129
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Abstract

This document gives guidance on the measurement and use of experimentally-determined relative sensitivity factors for the quantitative analysis of homogeneous materials by Auger electron spectroscopy and X-ray photoelectron spectroscopy. The methods described only apply to polycrystalline and amorphous materials, as effects inherent to single-crystal samples are not addressed.

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General information

  •  : Published
     : 2024-02
    : International Standard published [60.60]
  •  : 3
     : 22
  • ISO/TC 201/SC 7
    71.040.40 
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