ISO/PRF 19606

Under development (Edition 2, 2024)

This draft is in the approval phase.

Will replace ISO 19606:2017

Abstract

ISO 19606:2017 describes a method to evaluate the adequateness of a probe tip for fine-ceramic thin-film surface roughness measurements by atomic force microscopy, of surfaces with an arithmetical mean roughness, Ra, in the range of about 1 nm to 30 nm and a mean width of roughness profile elements, RSm, in the range of about 0,04 μm to 2,5 μm.

General information

Status
: Under development

Publication date
: 2024-11

Stage
: Proof sent to secretariat or FDIS ballot initiated: 8 weeks [50.20]
Edition
: 2

Number of pages
: 24
Technical Committee :
ISO/TC 206

ICS :
81.060.30
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